Skip to main content

Crystal and Electronic Structure Analyses on Bi2SiO5‐Added SrBi2(Ta1−xNbx)2O9 by Using Pulsed Neutron and Synchrotron X‐Ray Sources

Buy Article:

$51.00 plus tax (Refund Policy)

Abstract:

In this work, we prepared SrBi2(Ta1−x Nb x )2O9 (x = 0, 0.5, 1.0) and Bi2SiO5‐added SrBi2(Ta1−x Nb x )2O9, and then investigated their ferroelectric properties, crystal, and electronic structures. PE hysteresis‐loop and dielectric‐constant measurements demonstrated that the Nb substitution and the Bi2SiO5 addition increased the remanent polarization and the Curie temperature although these composition changes made the coercive field higher slightly by the substitution and the addition. The Rietveld analyses using the neutron diffraction data indicated that the Nb substitution induced higher tilting angles of the (Ta,Nb)‐O6 and distorted the octahedra. Larger distortions within the perovskite layer were also expected from electron‐density distributions visualized by the maximum‐entropy method using synchrotron X‐ray diffraction. These structure changes can be considered as one of the reasons for improvement of the electric properties.

Document Type: Research Article

DOI: http://dx.doi.org/10.1111/j.1551-2916.2012.05403.x

Publication date: December 1, 2012

bsc/jace/2012/00000095/00000012/art00036
dcterms_title,dcterms_description,pub_keyword
6
5
20
40
5

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
X
Cookie Policy
Ingenta Connect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more