Skip to main content

Combined Jonker and Ioffe Analysis of Oxide Conductors and Semiconductors

Buy Article:

$48.00 plus tax (Refund Policy)

Abstract:

Jonker plots (Seebeck coefficient versus logarithm of conductivity) have been utilized to obtain the product of the density of states (DOS) and mobility () in oxide semiconductors, from which the maximum electrical conductivity can be estimated for degenerate transparent conducting oxide (TCO) applications. In addition, the DOS– product can be utilized to predict the maximum achievable “power factor” (PF, Seebeck coefficient squared times conductivity) for oxide semiconductors. The PF is an important parameter governing the figure of merit for thermoelectric oxide (TEO) applications. The procedure employs an analysis developed by Ioffe, and provides an important screening tool for oxide (and other) thermoelectric materials, based upon data from polycrystalline ceramic specimens. Several oxides, including known transparent conductors, are considered as TCO and TEO case studies in the present work.

Document Type: Research Article

DOI: http://dx.doi.org/10.1111/j.1551-2916.2010.04047.x

Affiliations: 1: Department of Materials Science & Engineering, Northwestern University, Evanston, Illinois 60208 2: Argonne National Laboratory, Chemical Sciences and Engineering Division, Argonne, Illinois 60643

Publication date: January 1, 2011

bsc/jace/2011/00000094/00000001/art00026
dcterms_title,dcterms_description,pub_keyword
6
5
20
40
5

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
X
Cookie Policy
ingentaconnect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more