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Crystallization Behavior and Dielectric Properties of a New High Dielectric Constant Low-Temperature Cofired Ceramics Material Based on Nd2O3–TiO2–SiO2 Glass–Ceramics

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Abstract:

The crystallization and sintering behaviors of glass–ceramics (Nd2O3–TiO2–SiO2) have been investigated using the differential thermal analyzer, thermal mechanical analyzer, X-ray diffractometer, scanning electron microscopy, and transmission electron microscopy. The results showed that the onset of glass shrinkage occurred at around the glass transition temperature (Tg=708°C). The first crystalline phase, Nd2Ti4O11, was observed at around 775°C. Fully densified NdTiSi glass can be obtained via glass viscous flow before the second crystalline phase, Nd0.66TiO3, occurring at about 850°C. The as-prepared NdTiSi glass–ceramics sintered at 900°C exhibited a high dielectric constant of 23 and a quality factor of about 600, which provided a promising candidate for low-temperature cofired ceramics applications.

Document Type: Research Article

DOI: http://dx.doi.org/10.1111/j.1551-2916.2010.03655.x

Affiliations: Department of Resources Engineering, Particulate Materials Research Center, National Cheng Kung University, Tainan 70101, Taiwan, ROC

Publication date: June 1, 2010

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