Skip to main content

Crystallization Behavior and Dielectric Properties of a New High Dielectric Constant Low-Temperature Cofired Ceramics Material Based on Nd2O3–TiO2–SiO2 Glass–Ceramics

Buy Article:

$43.00 plus tax (Refund Policy)

The crystallization and sintering behaviors of glass–ceramics (Nd2O3–TiO2–SiO2) have been investigated using the differential thermal analyzer, thermal mechanical analyzer, X-ray diffractometer, scanning electron microscopy, and transmission electron microscopy. The results showed that the onset of glass shrinkage occurred at around the glass transition temperature (Tg=708°C). The first crystalline phase, Nd2Ti4O11, was observed at around 775°C. Fully densified NdTiSi glass can be obtained via glass viscous flow before the second crystalline phase, Nd0.66TiO3, occurring at about 850°C. The as-prepared NdTiSi glass–ceramics sintered at 900°C exhibited a high dielectric constant of 23 and a quality factor of about 600, which provided a promising candidate for low-temperature cofired ceramics applications.
No References
No Citations
No Supplementary Data
No Article Media
No Metrics

Document Type: Research Article

Affiliations: Department of Resources Engineering, Particulate Materials Research Center, National Cheng Kung University, Tainan 70101, Taiwan, ROC

Publication date: 2010-06-01

  • Access Key
  • Free content
  • Partial Free content
  • New content
  • Open access content
  • Partial Open access content
  • Subscribed content
  • Partial Subscribed content
  • Free trial content
Cookie Policy
Cookie Policy
Ingenta Connect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more