Skip to main content

Fabrication and Characterization of Sol–Gel Derived (100)-Textured (Pb0.97La0.02)(Zr0.95Ti0.05)O3 Thin Films

Buy Article:

$43.00 plus tax (Refund Policy)

A typical kind of antiferroelectric (AFE) thin films with the composition of (Pb0.97La0.02)(Zr0.95Ti0.05)O3 (PLZT) were successfully fabricated on the platinum-buffered silicon substrates through the modified sol–gel method. X-ray diffractometer results indicated that PLZT films possessed a pure perovskite structure with a strong (100) orientation. The dielectric permittivity-field and polarization–field measurements demonstrated the AFE nature of the PLZT thin films. The level of electric-field-induced strain was measured to be about 0.65% using an scanning probe microscope.
No References
No Citations
No Supplementary Data
No Data/Media
No Metrics

Document Type: Research Article

Affiliations: 1: Functional Materials Research Laboratory, Tongji University, Shanghai 200092, China 2: School of Materials and Metallurgy, Inner Mongolia University of Science and Technology, Baotou 014010, China

Publication date: 2009-12-01

  • Access Key
  • Free content
  • Partial Free content
  • New content
  • Open access content
  • Partial Open access content
  • Subscribed content
  • Partial Subscribed content
  • Free trial content
Cookie Policy
Cookie Policy
Ingenta Connect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more