Spatial Characterization of Piezoelectric Materials Using the Scanning Laser Intensity Modulation Method (LIMM)
A novel system for characterizing the spatial variation of piezoelectric properties of piezoelectric ceramic samples has been developed and tested in a series of case studies. The system has been shown to be capable of detecting various types of defects in PZT ceramic materials including localized sample depoling brought about through thermal and mechanical treatments. It has also been used to detect defects due to environmental degradation under high dc bias. The present system can be used as an R&D tool, but with further developments to increase the scanning speed the technique could be extended for use in a Quality Assurance environment.
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Document Type: Research Article
Affiliations: National Physical Laboratory, Teddington, Middlesex, TW11 0LW, UK
Publication date: 2008-07-01