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Orientation Control Growth of Lanthanum Nickelate Thin Films Using Chemical Solution Deposition

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Highly (100)- and (110)-oriented LaNiO3 (LNO) thin films were successfully prepared on a Si (100) substrate using the chemical solution deposition method. It was somewhat surprising to find that the orientation of LNO films depended on the heating rates of the temperature range of 200°–400°C. The samples with heating rates beyond 10°C/s showed the preferential (100) orientation, while those with heating rates below 6.67°C/s showed the preferential (110) orientation. The orientation mechanism is controlled by the thermodynamics of nucleation and crystal growth. LNO films with controlled orientation having low resistivities of 2 mΩ·cm are a good basis for integrating ferroelectric applications.

Document Type: Research Article

DOI: http://dx.doi.org/10.1111/j.1551-2916.2007.01912.x

Affiliations: Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China

Publication date: November 1, 2007

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