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Dielectric Relaxation in Layer-Structured SrBi2−xNdxNb2O9 Ceramics (x=0, 0.05, 0.2, 0.35)

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Abstract:

SrBi2−xNdxNb2O9 (x=0, 0.05, 0.2, 0.35) ceramics were synthesized by the traditional solid-state sintering method. X-ray diffraction analysis showed that single-phase-layered perovskites were obtained for all compositions. The substitution of Nd3+ for Bi3+ induced a relaxor behavior of frequency dispersion for Nd-doped SrBi2Nb2O9.The parameter of frequency dispersion ΔTm, which is the Tm between 1 kHz and 1 MHz, increases from 0°C for x=0 to 13°C for x=0.35, and the degree of relaxor behavior  increases from 0.96 for x=0 to 2.02 for x=0.35. The temperature of the maximum dielectric constant Tm decreases linearly with an increase in the Nd content (x).

Document Type: Research Article

DOI: http://dx.doi.org/10.1111/j.1551-2916.2006.01405.x

Affiliations: State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, China

Publication date: January 1, 2007

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