Skip to main content

Key Factors Controlling Camber Behavior During the Cofiring of Bi-Layer Ceramic Dielectric Laminates

Buy Article:

$43.00 plus tax (Refund Policy)

A bi-layer low-temperature-cofired ceramic laminate with different dielectric constants has been used to investigate the key factors controlling camber behavior during cofiring. Camber development, which is caused by the linear shrinkage rate difference between dielectrics, becomes more significant with decreasing thickness of dielectric. No cofiring defects, such as de-densification, de-bonding, and channel cracks, are observed in the multilayer structure of mixed dielectric laminates. This is because of the fact that a common sintering flux is used in both dielectrics, and the sintering mismatch stress generated in the dielectric layer is less than that of sintering potential.
No References
No Citations
No Supplementary Data
No Article Media
No Metrics

Document Type: Research Article

Affiliations: Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu, Taiwan

Publication date: 2005-09-01

  • Access Key
  • Free content
  • Partial Free content
  • New content
  • Open access content
  • Partial Open access content
  • Subscribed content
  • Partial Subscribed content
  • Free trial content
Cookie Policy
X
Cookie Policy
Ingenta Connect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more