Initial Attempt to Characterize Oxidation Damage in C/Sic Composite Using an Ultrasonic Guided Wave Method
Abstract:An ultrasonic guided wave scan system was used to non-destructively monitor damage over time and position in a C/enhanced SiC sample that was creep tested to failure at 1200°C in air at a stress of 69 MPa (10 ksi). The use of the guided wave scan system for mapping evolving oxidation profiles (via porosity gradients resulting from oxidation) along the sample length and predicting failure location was explored. The creep-rupture tests were interrupted for ultrasonic evaluation every two hours until failure at ∼17.5 cumulative hours.
Document Type: Research Article
Publication date: August 1, 2005