Skip to main content

Initial Attempt to Characterize Oxidation Damage in C/Sic Composite Using an Ultrasonic Guided Wave Method

Buy Article:

$51.00 plus tax (Refund Policy)


An ultrasonic guided wave scan system was used to non-destructively monitor damage over time and position in a C/enhanced SiC sample that was creep tested to failure at 1200°C in air at a stress of 69 MPa (10 ksi). The use of the guided wave scan system for mapping evolving oxidation profiles (via porosity gradients resulting from oxidation) along the sample length and predicting failure location was explored. The creep-rupture tests were interrupted for ultrasonic evaluation every two hours until failure at ∼17.5 cumulative hours.

Document Type: Research Article


Affiliations: 1: National Aeronautics and Space Administration, Glenn Research Center, Cleveland, Ohio 44135 2: Cleveland State University, Cleveland, Ohio 44115

Publication date: 2005-08-01

  • Access Key
  • Free content
  • Partial Free content
  • New content
  • Open access content
  • Partial Open access content
  • Subscribed content
  • Partial Subscribed content
  • Free trial content
Cookie Policy
Cookie Policy
Ingenta Connect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more