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Publisher: Wiley-Blackwell

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Volume 7, Number 5, September/October 2010

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Foreword: Introduction
pp. 565-565(1)
Author: Templeton, Douglas W.

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The Damage Mechanism Route to Better Armor Materials
pp. 566-573(8)
Authors: Shockey, Donald A.; Simons, Jeffrey W.; Curran, Donald R.

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Armor Options: A Comparison of the Dynamic Response of Materials in the Aluminum Oxide–Aluminum Nitride Family
pp. 587-594(8)
Authors: Alexander, C. Scott; Reinhart, William D.; Thornhill, Tom F.; Chhabildas, Lalit C.

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The Use of Sphere Indentation Experiments to Characterize Ceramic Damage Models
pp. 606-615(10)
Authors: Leavy, R. Brian; Brannon, Rebecca M.; Strack, O. Erik

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Dynamic Ring-on-Ring Equibiaxial Flexural Strength of Borosilicate Glass
pp. 616-624(9)
Authors: Nie, Xu; Chen, Weinong W.; Templeton, Douglas W.

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Using Hertzian Indentation to Understand the Strength and Ballistic Resistance of Silicon Carbide
pp. 625-634(10)
Authors: Holmquist, Timothy J.; Wereszczak, Andrew A.

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Size-Scaling of Tensile Failure Stress in a Hot-Pressed Silicon Carbide
pp. 635-642(8)
Authors: Wereszczak, Andrew A.; Kirkland, Timothy P.; Strong, Kevin T.; Campbell, James; LaSalvia, Jerry C.; Miller, Herbert T.

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Flexural Strength, Fracture Toughness, and Hardness of Silicon Carbide and Boron Carbide Armor Ceramics
pp. 643-651(9)
Authors: Vargas-Gonzalez, Lionel; Speyer, Robert F.; Campbell, James

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Nondestructive Evaluation (NDE) for Characterizing Oxidation Damage in Cracked Reinforced Carbon–Carbon
pp. 652-661(10)
Authors: Roth, Don J.; Jacobson, Nathan S.; Rauser, Richard W.; Wincheski, Russell A.; Walker, James L.; Cosgriff, Laura A.

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CMAS-Resistant Thermal Barrier Coatings (TBC)
pp. 662-674(13)
Authors: Rai, Amarendra K.; Bhattacharya, Rabi S.; Wolfe, Douglas E.; Eden, Timothy J.

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Tribology–Structure Relationships in Silicon Oxycarbide Thin Films
pp. 675-686(12)
Authors: Ryan, Joseph V.; Colombo, Paolo; Howell, Jane A.; Pantano, Carlo G.

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Metal Corrosion and its Impact on Glass Tempering Furnace Design
pp. 687-696(10)
Authors: Tiernan, Peter; Naughton, Michael D.

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