Publisher: Wiley-Blackwell

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Volume 28, Number 8, August 2005

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Tensile testing of silicon thin films
pp. 665-674(10)
Author: TSUCHIYA, T.

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Fracture toughness measurement of thin-film silicon
pp. 687-694(8)
Authors: ANDO, T.; LI, X.; NAKAO, S.; KASAI, T.; TANAKA, H.; SHIKIDA, M.; SATO, K.

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Fracture tests of microsized TiAl specimens
pp. 695-701(7)
Authors: HALFORD, T. P.; TAKASHIMA, K.; HIGO, Y.; BOWEN, P.

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A study of the mechanical and fatigue properties of metallic microwires
pp. 723-733(11)
Authors: KHATIBI, G.; BETZWAR-KOTAS, A.; GRÖGER, V.; WEISS, B.

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Micromechanical testing of SU-8 cantilevers
pp. 735-742(8)
Authors: HOPCROFT, M.; KRAMER, T.; KIM, G.; TAKASHIMA, K.; HIGO, Y.; MOORE, D.; BRUGGER, J.

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Amorphous Mo–N and Mo–Si–N films in microelectromechanical systems
pp. 743-749(7)
Authors: KATTELUS, H.; YLÖNEN, M.; BLOMBERG, M.

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