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Publisher: Wiley-Blackwell

Volume 68, Number 3, 1 May 2012

Enumeration of one‐dimensional crystal structures obtained from a minimum of diffraction intensities
pp. 313-318(6)
Authors: Al‐Asadi, Ahmed; Chudin, Eugene; Tsodikov, Oleg V.

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High‐resolution study of (002, 113, 11−1) four‐beam diffraction in Si
pp. 331-336(6)
Authors: Kohn, V. G.; Kazimirov, A.

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An improved experimental databank of transferable multipolar atom models – ELMAM2. Construction details and applications
pp. 337-351(15)
Authors: Domagała, Sławomir; Fournier, Bertrand; Liebschner, Dorothee; Guillot, Benoît; Jelsch, Christian

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Refining structures against reflection rank: an alternative metric for electron crystallography
pp. 352-358(7)
Authors: Eggeman, Alexander S.; Midgley, Paul A.

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Density functional calculations of polysynthetic Brazil twinning in α‐quartz
pp. 359-365(7)
Authors: Grimmer, Hans; Delley, Bernard

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Temperature diffuse scattering of nanocrystals
pp. 382-392(11)
Authors: Beyerlein, K. R.; Leoni, M.; Scardi, P.

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Topological complexity of crystal structures: quantitative approach
pp. 393-398(6)
Author: Krivovichev, Sergey

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Report of the Executive Committee for 2010
pp. 401-429(29)
Author: Dacombe, M.

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