A local-influence-based diagnostic approach to a speeded item response theory model
An item response theory model for dealing with omitted responses in a test is proposed. In this model formulation, non-response does not only depend on an examinee's ability and on item difficulty, but additionally also on ‘test speededness’. Using a local-influence-based diagnostic approach, the sensitivity of the model regarding assumptions concerning the drop-out mechanism is explored. The methodology proposed is applied to the Chilean Sistema de Medición de la Calidad de la Educación mathematics test case-study.
Document Type: Research Article
Affiliations: 1: Katholieke Universiteit Leuven, Belgium, and University of Southern Denmark, Odense, Denmark 2: Katholieke Universiteit Leuven, Belgium 3: Hasselt University, Diepenbeek, Belgium 4: Pontificia Universidad Católica de Chile, Santiago, Chile
Publication date: 2006-11-01