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Nonparametric estimation of a change in defect intensity

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Abstract:

Summary. 

In an important class of problems involving mixture distributions, interest focuses on the mixture proportions, considering other possible parameters as nuisance parameters. We formulate a new variation on such problems that arose in a study on the link between the number of cells in a charge-coupled detector image sensor that turned defective because of cosmic radiation and the storage conditions of such sensors. In this variation, the component densities are bivariate, there are two classes and only a subset of the mixture proportions is of relevance. We propose a nonparametric method to estimate the relevant subset of the proportions and apply our method to the data in our study.

Keywords: Charge-coupled detector image sensors; Mixture model; Mixture proportions; Nonparametric estimation

Document Type: Research Article

DOI: https://doi.org/10.1111/j.1467-9876.2005.00472.x

Affiliations: 1: Philips Research, Eindhoven, the Netherlands 2: Philips Research, Eindhoven, University of Amsterdam, the Netherlands, and Wesleyan University, Middletown, USA

Publication date: 2005-01-01

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