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Publisher: Wiley-Blackwell

Volume 18, Number 1, February 2004

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Economic Efficiency and Frontier Techniques
pp. 33-77(45)
Authors: Murillo‐Zamorano, Luis R.

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Measurement Bias in the HICP: What do we know and What do we need to know?
pp. 79-112(34)
Authors: Wynne, Mark A.; Rodriguez‐Palenzuela, Diego

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