The Accelerated Failure Time Model Under Biased Sampling
Chen (2009, Biometrics) studies the semi-parametric accelerated failure time model for data that are size biased. Chen considers only the uncensored case and uses hazard-based estimation methods originally developed for censored observations. However, for uncensored data, a simple linear regression on the log scale is more natural and provides better estimators.
Document Type: Research Article
Publication date: December 1, 2010