Requirements for commercial X-ray element-specifc imaging technology
Analysis of the composition of material samples non-destructively by means of standard X-ray tube imaging is extremely challenging due to the breadth of the bremsstrahlung spectrum, resulting from mono-energetic electrons striking a thick tungsten target. In previous work, stacks of registered field-flattened images of various samples over an energy range 15150 keV were created and analysed. Attempts to remove the effects of the broad spectrum proved the concept of element-specific imaging, but problems still remained. In this work, modification strategies to existing designs are proposed in both hardware and software, which would bolster efforts to remove the effects of the broad X-ray spectrum.
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Document Type: Research Article
Affiliations: James C Austin is with the University of Keele, Keele, Staffordshire ST5 5BG, UK.
Publication date: 01 March 2011
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- Official Journal of The British Institute of Non-Destructive Testing - includes original research and devlopment papers, technical and scientific reviews and case studies in the fields of NDT and CM.
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