Advanced multi-sensor and multi-source industrial computed tomography systems
Authors: Simon, M; Tiseanu, I; Sauerwein, C; Yoo, S-M; Cho, I-S
Source: Insight - Non-Destructive Testing and Condition Monitoring, Volume 50, Number 6, June 2008 , pp. 320-322(3)
Abstract:To extend the range of applications for industrial computed tomography systems, different approaches making use of several X-ray sources and detectors are presented. The combination of microfocus sources with high-voltage and high-power sources makes it possible to combine micro-CT and macro-CT applications in a single system. Digital flat panel detectors combined with line detectors allow for fast volumetric scanning and high-quality data acquisition over a wide range of part size. The benefit from multi-sensor and multi-source X-ray tomography systems is demonstrated by results from different applications, with a focus on light metal parts.
Document Type: Research article
Publication date: 2008-06-01
- Official Journal of The British Institute of Non-Destructive Testing - includes original research and devlopment papers, technical and scientific reviews and case studies in the fields of NDT and CM.
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