Calculation of Young's Modulus Value by Means of AFM
Keywords: AFM Operation Modes; AFM Probes; AFM-FS; Atomic Force Microscopy; Derjaguin; Muller and Toporov model; DMT; Force Spectroscopy (FS); Hard materials; Hertz Model; Johnson; Kendall and Roberts (JKR) Model; Scanning Probe Microscopies (SPMs); Scanning Tunneling Microscope; Young's modulus; adhesion forces; ceramics; cylindrical piezoelectric tube; elastic penetration depth; jump-off-contact; microfabricated probe; nanomechanics; picoindentation technique; picoindenter; sample topography; transition force; tun-nelling current
Document Type: Research Article
Publication date: 2011-01-01
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