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Calculation of Young's Modulus Value by Means of AFM

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Abstract:

In the last years, Atomic Force Microscopy (AFM) has become a powerful tool not only to study the surface morphology but also the nanomechanics of all kind of samples. In this paper, the applicability of this technique is reviewed and its basic aspects of operation, advantages and drawbacks of using the AFM probe as a picoindenter (Force Spectroscopy mode, FS-AFM) are discussed. The patents concerning picoindentation measurements are discussed in the text and special attention is paid to measurements performed on hard materials as ceramics, as they have not been as thoroughly reviewed in the literature as in the case of soft matter. The possibilities of AFM in the nanomechanics field include the quantitative determination of the Young's modulus (E) and the transition force from elastic to plastic deformation regimes, the measurement of adhesion forces and deformation mechanisms while applying vertical forces in the range from tens of pN to μN.





Keywords: AFM Operation Modes; AFM Probes; AFM-FS; Atomic Force Microscopy; Derjaguin, Muller and Toporov model, DMT; Force Spectroscopy (FS); Hard materials; Hertz Model; Johnson, Kendall and Roberts (JKR) Model; Scanning Probe Microscopies (SPMs); Scanning Tunneling Microscope; Young's modulus; adhesion forces; ceramics; cylindrical piezoelectric tube; elastic penetration depth; jump-off-contact; microfabricated probe; nanomechanics; picoindentation technique; picoindenter; sample topography; transition force; tun-nelling current

Document Type: Research Article

Publication date: January 1, 2011

More about this publication?
  • Recent Patents on Nanotechnology publishes review articles by experts on recent patents on nanotechnology. A selection of important and recent patents on nanotechnology is also included in the journal. The journal is essential reading for all researchers involved in nanotechnology.
ben/nanotec/2011/00000005/00000001/art00003
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