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The ability of new Magneto-Impedance (MI) sensors having a giant effect (GMI) intended for Non Destructive Testing (NDT) is reported. The sensors are based on Co-rich amorphous microwires or thin film nanocrystalline sandwiched structures exhibiting high MI effect. Sensitivities-to-field around a few hundred of %/mT are obtained in microwires and sandwiched FeSiBCuNb/Cu/FeSiBCuNb structures. Real and imaginary components of GMI ratio are also investigated and discussed.
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