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Synthesis and Characterization of Diluted Magnetic Semiconducting Zn1−xMnxS Nanostructured Films

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In recent years the dilute magnetic semiconductors have received much attention due to the complementary properties of semiconductor and ferromagnetic behaviour. Nanostructured Zn1−xMnxS films (0 ≤ x ≤ 0 25) were deposited on glass substrates at room temperature (300 K) using simple resistive thermal evaporation technique. All the deposited films were characterized by chemical, structural, morphological and optical studies. Atomic Force Microscopy (AFM) studies showed that all the films investigated were in nanocrystalline form with the crystallite size lying in the range 8–25 nm. All the films exhibited cubic structure and the lattice parameter varied linearly with composition. The variation of refractive index and extinction coefficient with photon energy for the films grown at room temperature were studied. The Zn1−xMnxS films were showed an absorption coefficient >104 cm−1 with the energy band gap 3.44–4.01 eV measured at room temperature.
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Keywords: DILUTED MAGNETIC SEMICONDUCTORS (DMS); OPTICAL PROPERTIES; STRUCTURAL; THERMAL EVAPORATION TECHNIQUE; ZN1−XMNXS NANOCRYSTALLINE FILMS

Document Type: Research Article

Publication date: 01 April 2008

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