Parametric Model Reduction for Fast Simulation of Cyclic Voltammograms

Authors: Feng, Lihong; Koziol, Darius; Rudnyi, Evgenii B.; Korvink, Jan G.

Source: Sensor Letters, Volume 4, Number 2, June 2006 , pp. 165-173(9)

Publisher: American Scientific Publishers

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Abstract:

Model order reduction is a well-established technique for fast simulation of large-scale models based on ordinary differential equations, especially those in the field of integrated circuits and micro-electro-mechanical systems. In this paper, we propose the use of parametric model reduction for fast simulation of a cyclic voltammogram. Instead of being considered as a time varying system, the model for a cyclic voltammogram is treated as a system with a parameter (applied voltage) which is to be preserved during model reduction. Because voltage is preserved in the symbolic form during model reduction, we can simulate the cyclic voltammogram with a reduced system and therefore invest much less time and memory as compared with direct simulation based on the original large-scale model. We present our approach for a case study based on scanning electrochemical microscopy.

Keywords: MODEL ORDER REDUCTION; COMPACT MODEL; SIMULATION; SCANNING ELECTROCHEMICAL MICROSCOPY (SECM); VOLTAMMOGRAM

Document Type: Research article

DOI: 10.1166/sl.2006.021

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