Skip to main content

Open Access Direct Imaging of Lithium Ions Using Aberration-Corrected Annular-Bright-Field Scanning Transmission Electron Microscopy and Associated Contrast Mechanisms

Download Article:
 Download
(PDF 12115.97265625 kb)
 

Abstract:

The vast potential and fast development of implementing lithium-based batteries as an alternative power source to replace the existing low-efficiency and environmental-hazardous materials have urged an ever expediting pace for investigation of the corresponding characterization methods, in particular to observe lithium ions at atomic scale. Here we demonstrate a feasible annular-bright-field (ABF) imaging method based on aberration-corrected scanning transmission electron microscopy to observe lithium ions directly at atomic resolution using LiFePO4, a positive electrode material routinely used, for a case study. In addition, we performed extensive image simulations, including the influences from specimen thickness, high tension, illumination angle, collection angle, material vacancy and lattice distortion, to compare and interpret explicitly the displayed image contrast and the attainable optimum operation conditions.

Keywords: ABERRATION-CORRECTION; ANNULAR-BRIGHT-FIELD (ABF); LITHIUM-ION BATTERY; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM)

Document Type: Research Article

DOI: https://doi.org/10.1166/mex.2011.1006

Publication date: 2011-03-01

More about this publication?
  • Materials Express is a peer-reviewed multidisciplinary journal reporting emerging researches on materials science, engineering, technology and biology. Cutting-edge researches on the synthesis, characterization, properties, and applications of a very wide range of materials are covered for broad readership; from physical sciences to life sciences. In particular, the journal aims to report advanced materials with interesting electronic, magnetic, optical, mechanical and catalytic properties for industrial applications.
  • Editorial Board
  • Information for Authors
  • Subscribe to this Title
  • Ingenta Connect is not responsible for the content or availability of external websites
  • Access Key
  • Free content
  • Partial Free content
  • New content
  • Open access content
  • Partial Open access content
  • Subscribed content
  • Partial Subscribed content
  • Free trial content
Cookie Policy
X
Cookie Policy
Ingenta Connect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more