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Scanning probe microscopy (SPM) typically covers atomic force microscopy (AFM), scanning tunneling microscopy (STM), near-field scanning optical microscopy (NSOM, or SNOM) and related technologies. Since its invention in early 1980s, SPM has now been regarded as one of the major driving forces for the rapid development of nanoscience and nanotechnology, and the tool of choice in many areas of research. Journal of Scanning Probe Microscopy (JSPM) provides a forum for rapid dissemination of important developments in SPM technology. JSPM offers scientists, engineers and developers timely, peer-reviewed research on SPM science and technology of the highest quality. JSPM publishes original rapid communications, full research papers and timely state-of-the-art reviews (with author's photo and biography) encompassing the fundamental and applied research on SPM in all fields of science, engineering, and medicine.

Publisher: American Scientific Publishers

Volume 3, Numbers 1-2, June/December 2008
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Research Article

Size Determination of Nanoparticles Based on Tapping-Mode Atomic Force Microscopy Measurements
pp. 1-8(8)
Authors: Mott, Derrick; Cotts, Benjamin; Lim, I-Im S.; Luo, Jin; Park, Hye-Young; Njoki, Peter N.; Schadt, Mark J.; Zhong, Chuan-Jian

Probing the Conductance of Single Atoms and Molecules
pp. 9-12(4)
Authors: Néel, Nicolas; Kröger, Jörg; Limot, Laurent; Berndt, Richard

Surface Potential Evaluations of Ferritin Nanodots by Kelvin Force Microscopy
pp. 13-18(6)
Authors: Yamamoto, Shin-ichi; Kobayashi, Kei; Yamada, Hirofumi; Yoshioka, Hideki; Uraoka, Yukiharu; Fuyuki, Takashi; Okuda, Mitsushiro; Yamashita, Ichiro

Analysis of Cross-Sections of Ditylum Brightwelli Biosilica by Tapping Mode Atomic Force Microscopy and Scanning Electron Microscopy
pp. 19-24(6)
Authors: Heredia, Alejandro; Silva, Sónia; Santos, Conceição; Delgadillo, Ivonne; Vrieling, Engel G.

Scanning Tunneling Microscopy of Rotavirus VP6 Protein Self-Assembled into Nanotubes and Nanospheres
pp. 25-31(7)
Authors: Rodríguez-Galván, Andrés; Heredia, Alejandro; Plascencia-Villa, Germán; Ramírez, Octavio T.; Palomares, Laura A.; Basiuk, Vladimir A.

Atomic Force Microscopy Studies of Carbon Nanostructures Grown by Radio Frequency Plasma Enhanced CVD (RF-PECVD)
pp. 32-35(4)
Authors: Mahapatra, Ojas; Maheswaran, R.; Rao, B. Purna Chandra; Gopalakrishnan, C.; Thiruvadigal, D. John

An Empirical Approach to Calculate the Number of Atoms in Column-Domains by HAADF-STEM Analysis: A Binary Approximation in the Nb16W18O94 Ternary System
pp. 36-41(6)
Authors: Rendon, L.; Santiago, P.

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