Home >> Journal of Scanning Probe Microscopy, Volume 2, Numbers 1-2
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Scanning probe microscopy (SPM) typically covers atomic force microscopy (AFM), scanning tunneling microscopy (STM), near-field scanning optical microscopy (NSOM, or SNOM) and related technologies. Since its invention in early 1980s, SPM has now been regarded as one of the major driving forces for the rapid development of nanoscience and nanotechnology, and the tool of choice in many areas of research. Journal of Scanning Probe Microscopy (JSPM) provides a forum for rapid dissemination of important developments in SPM technology. JSPM offers scientists, engineers and developers timely, peer-reviewed research on SPM science and technology of the highest quality. JSPM publishes original rapid communications, full research papers and timely state-of-the-art reviews (with author's photo and biography) encompassing the fundamental and applied research on SPM in all fields of science, engineering, and medicine.

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Publisher: American Scientific Publishers

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Volume 2, Numbers 1-2, June/December 2007

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Editorial

Free Content Scanning Probe Microscopy in Materials Research—ICMAT 2007 Conference (International Conference on Materials for Advanced Technology) Symposium G
pp. i-i(1)
Author: Chandrasekhar, N.

Research Articles

Free Content A Well Defined Electron Beam Source Produced by the Controlled Field Assisted Etchingof Metal Tips to < 1 nm Radius
pp. 1-4(4)
Authors: Rezeq, Moh'd; Pitters, Jason; Wolkow, Robert

Free Content Scanning Probe Microscopy for Surface Roughness Characterization of Lactose Carriers Used in Dry Powder Inhalation Therapy
pp. 5-9(5)
Authors: Karande, A.D.; Zhou, Q.; Chan, L.W.; Heng, P.W.S.; Liew, C.V.

Free Content Structural Integrity and Transport Characteristics of STM-Defined, Highly-Doped Si:P Nanodots
pp. 10-14(5)
Authors: Rueß, Frank J.; Pok, Wilson; Reusch, Thilo C.G.; Scappucci, Giordano; Füchsle, Martin; Mitic, Mladen; Thompson, Daniel L.; Simmons, Michelle Y.

Free Content Nanoscale Acoustic Near-Field Imaging in an SEM/SPM Hybrid System with Sub-Picometer Sensitivity
pp. 15-18(4)
Authors: Thomas, C.h.; Heiderhoff, R.; Balk, L.J.

Free Content Study and Manipulation of Single Functionalized Molecules by Low Temperature STM
pp. 19-23(5)
Authors: Grill, L.; Alemani, M.; Rieder, K.H.; Moresco, F.; Rapenne, G.; Joachim, C.; Peters, M.V.; Hecht, S.

Free Content Surface Characterization of TaN-Cu Nanocomposite Thin Films Using Scanning Surface Potential Microscopy
pp. 24-27(4)
Authors: Hsieh, J.H.; Liu, P.C.; Cheng, M.K.; Kuo, P.W.

Free Content Effects of Tip Voltage and Writing Speed on the Formation of Silicon Oxide Nanodots Patterned by Scanning Probe Lithography
pp. 28-31(4)
Authors: Hutagalung, Sabar D.; Darsono, Teguh; Yaacob, Khatijah A.; Ahmad, Zainal A.

Free Content Polymerization on DNA Templates for Nanoelectronics Applications
pp. 32-35(4)
Authors: Rajwade, S.R.; Kulkarni, P.D.; Mukherji, S.; Rao, K.K.; Ramgopal Rao, V.

Free Content Morphological and Interfacial Investigations at Ni/Si System
pp. 36-40(5)
Authors: Agarwal, Shivani; Jain, Ankur; Karar, N.; Chakraborty, B.R.; Gupta, Ajay; Jain, I.P.

Free Content Dynamics of Phospholipid Membrane Growth and Drug-Membrane Interactions Probed by Atomic Force Microscopy
pp. 41-45(5)
Authors: Nussio, Matthew R.; Liddell, Matthew; Sykes, Matthew J.; Miners, John O.; Shapter, Joseph G.

Free Content Vorticella Stalk Characterization via Atomic Force Microscopy
pp. 46-50(5)
Authors: Andrade, M.F.; Valdez, M.; Virgen-Ortiz, A.; Trujillo, X.; Huerta, M.; Marin, J.L.

Free Content Imaging of Pristine and Functionalized Carbon Nanotubes by Scanning Tunneling Microscopy
pp. 51-57(7)
Authors: Wei, Guoxiu; Greiner, Mark T.; Kruse, Peter

Free Content Atomic Force Microscopy Studies of Silver Nanoislands Synthesised from Aspergillus versicolor
pp. 58-62(5)
Authors: Gopalakrishnan, C.; Ramaswamy, Shivaraman; Memoriya, Usha

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