Skip to main content

Scanning probe microscopy (SPM) typically covers atomic force microscopy (AFM), scanning tunneling microscopy (STM), near-field scanning optical microscopy (NSOM, or SNOM) and related technologies. Since its invention in early 1980s, SPM has now been regarded as one of the major driving forces for the rapid development of nanoscience and nanotechnology, and the tool of choice in many areas of research. Journal of Scanning Probe Microscopy (JSPM) provides a forum for rapid dissemination of important developments in SPM technology. JSPM offers scientists, engineers and developers timely, peer-reviewed research on SPM science and technology of the highest quality. JSPM publishes original rapid communications, full research papers and timely state-of-the-art reviews (with author's photo and biography) encompassing the fundamental and applied research on SPM in all fields of science, engineering, and medicine.

Journal of Scanning Probe Microscopy is now published as Journal of Advanced Microscopy Research.

Publisher: American Scientific Publishers

More about this publication?
Volume 2, Numbers 1-2, June/December 2007

Editorial

Research Articles

Favourites:
ADD

Scanning Probe Microscopy for Surface Roughness Characterization of Lactose Carriers Used in Dry Powder Inhalation Therapy
pp. 5-9(5)
Authors: Karande, A. D.; Zhou, Q.; Chan, L. W.; Heng, P. W. S.; Liew, C. V.

Favourites:
ADD

Structural Integrity and Transport Characteristics of STM-Defined, Highly-Doped Si:P Nanodots
pp. 10-14(5)
Authors: Rueß, Frank J.; Pok, Wilson; Reusch, Thilo C. G.; Scappucci, Giordano; Füchsle, Martin; Mitic, Mladen; Thompson, Daniel L.; Simmons, Michelle Y.

Favourites:
ADD

Nanoscale Acoustic Near-Field Imaging in an SEM/SPM Hybrid System with Sub-Picometer Sensitivity
pp. 15-18(4)
Authors: Thomas, Ch.; Heiderhoff, R.; Balk, L. J.

Favourites:
ADD

Study and Manipulation of Single Functionalized Molecules by Low Temperature STM
pp. 19-23(5)
Authors: Grill, L.; Alemani, M.; Rieder, K.-H.; Moresco, F.; Rapenne, G.; Joachim, C.; Peters, M. V.; Hecht, S.

Favourites:
ADD

Surface Characterization of TaN-Cu Nanocomposite Thin Films Using Scanning Surface Potential Microscopy
pp. 24-27(4)
Authors: Hsieh, J. H.; Liu, P. C.; Cheng, M. K.; Kuo, P. W.

Favourites:
ADD

Effects of Tip Voltage and Writing Speed on the Formation of Silicon Oxide Nanodots Patterned by Scanning Probe Lithography
pp. 28-31(4)
Authors: Hutagalung, Sabar D.; Darsono, Teguh; Yaacob, Khatijah A.; Ahmad, Zainal A.

Favourites:
ADD

Polymerization on DNA Templates for Nanoelectronics Applications
pp. 32-35(4)
Authors: Rajwade, S. R.; Kulkarni, P. D.; Mukherji, S.; Rao, K. K.; Ramgopal Rao, V.

Favourites:
ADD

Morphological and Interfacial Investigations at Ni/Si System
pp. 36-40(5)
Authors: Agarwal, Shivani; Jain, Ankur; Karar, N.; Chakraborty, B. R.; Gupta, Ajay; Jain, I. P.

Favourites:
ADD

Dynamics of Phospholipid Membrane Growth and Drug-Membrane Interactions Probed by Atomic Force Microscopy
pp. 41-45(5)
Authors: Nussio, Matthew R.; Liddell, Matthew; Sykes, Matthew J.; Miners, John O.; Shapter, Joseph G.

Favourites:
ADD

Vorticella Stalk Characterization via Atomic Force Microscopy
pp. 46-50(5)
Authors: Andrade, M. F.; Valdez, M.; Virgen-Ortiz, A.; Trujillo, X.; Huerta, M.; Marin, J. L.

Favourites:
ADD

Imaging of Pristine and Functionalized Carbon Nanotubes by Scanning Tunneling Microscopy
pp. 51-57(7)
Authors: Wei, Guoxiu; Greiner, Mark T.; Kruse, Peter

Favourites:
ADD

Atomic Force Microscopy Studies of Silver Nanoislands Synthesised from Aspergillus versicolor
pp. 58-62(5)
Authors: Gopalakrishnan, C.; Ramaswamy, Shivaraman; Memoriya, Usha

Favourites:
ADD

  • Access Key
  • Free content
  • Partial Free content
  • New content
  • Open access content
  • Partial Open access content
  • Subscribed content
  • Partial Subscribed content
  • Free trial content
Cookie Policy
X
Cookie Policy
Ingenta Connect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more