Home >> Journal of Scanning Probe Microscopy, Volume 1, Number 2
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Scanning probe microscopy (SPM) typically covers atomic force microscopy (AFM), scanning tunneling microscopy (STM), near-field scanning optical microscopy (NSOM, or SNOM) and related technologies. Since its invention in early 1980s, SPM has now been regarded as one of the major driving forces for the rapid development of nanoscience and nanotechnology, and the tool of choice in many areas of research. Journal of Scanning Probe Microscopy (JSPM) provides a forum for rapid dissemination of important developments in SPM technology. JSPM offers scientists, engineers and developers timely, peer-reviewed research on SPM science and technology of the highest quality. JSPM publishes original rapid communications, full research papers and timely state-of-the-art reviews (with author's photo and biography) encompassing the fundamental and applied research on SPM in all fields of science, engineering, and medicine.

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Publisher: American Scientific Publishers

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Volume 1, Number 2, December 2006

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Research Articles

Free Content Strategies for the Deposition of Free Radical Organic Molecules for Scanning-Probe Microscopy Experiments
pp. 55-62(8)
Authors: Pong, Wing-Tat; Durkan, Colm; Li, Hongwei; Harneit, Wolfgang

Free Content Atomic Force Microscopy Analysis of Bacterial Surface Morphology Before and After Cell Washing
pp. 63-73(11)
Authors: Gallardo-Moreno, A.M.; Liu, Y.; González-Martín, M.L.; Camesano, T.A.

Free Content Nanoscale Electromechanical and Mechanical Imaging of Butterfly Wings by Scanning Probe Microscopy
pp. 74-78(5)
Authors: Gruverman, A.; Rodriguez, B.J.; Kalinin, S.V.

Free Content Observation of Electron Standing Waves on Bi2Te3 Grains
pp. 79-81(3)
Authors: Winiarz, Szymon; Walachova, Jarmila; Szuba, Stanisław; Czajka, Ryszard

Free Content Force-Distance Spectroscopy and Morphology Statistics Studies of Composite Zirconia-Silica Thin Films
pp. 82-92(11)
Authors: Sahoo, N.K.; Tokas, R.B.; Thakur, S.; Kamble, N.M.

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