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NanoLaboratory Concept: A Platform Combining Advanced Scanning Probe Microscopy and Non-Scanning Probe Microscopy Methods

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Abstract:

The NanoLaboratory concept is described as the technical platform for joining of advanced scanning probe microscopy to the most modern non-scanning probe microscopy methods. Specific examples of how current limitations can be overcome in scanning probe microscopy itself (improvement of system stability for nanomanupulations and nanolithography) and of new possibilities gained from a multidisciplinary approach (scanning probe microscopy-based tomography and ultra-high resolution optical methods) are considered in terms of a scanning probe microscopy development perspectives.

Keywords: DRIFTS COMPENSATION IN SPM; NANOLABORATORY; SCANNING PROBE MICROSCOPY; SPM-BASED TOMOGRAPHY; TIP-ENHANCED RAMAN SCATTERING

Document Type: Short Communication

DOI: https://doi.org/10.1166/jspm.2006.005

Publication date: 2006-06-01

More about this publication?
  • Scanning probe microscopy (SPM) typically covers atomic force microscopy (AFM), scanning tunneling microscopy (STM), near-field scanning optical microscopy (NSOM, or SNOM) and related technologies. Since its invention in early 1980s, SPM has now been regarded as one of the major driving forces for the rapid development of nanoscience and nanotechnology, and the tool of choice in many areas of research. Journal of Scanning Probe Microscopy (JSPM) provides a forum for rapid dissemination of important developments in SPM technology. JSPM offers scientists, engineers and developers timely, peer-reviewed research on SPM science and technology of the highest quality. JSPM publishes original rapid communications, full research papers and timely state-of-the-art reviews (with author's photo and biography) encompassing the fundamental and applied research on SPM in all fields of science, engineering, and medicine.
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