NanoLaboratory Concept: A Platform Combining Advanced Scanning Probe Microscopy and Non-Scanning Probe Microscopy Methods

Author: Andreyuk, Denis

Source: Journal of Scanning Probe Microscopy, Volume 1, Number 1, June 2006 , pp. 51-54(4)

Publisher: American Scientific Publishers

Abstract:

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Keywords: SCANNING PROBE MICROSCOPY; NANOLABORATORY; DRIFTS COMPENSATION IN SPM; SPM-BASED TOMOGRAPHY; TIP-ENHANCED RAMAN SCATTERING

Document Type: Short communication

DOI: http://dx.doi.org/10.1166/jspm.2006.005

Publication date: 2006-06-01

• Scanning probe microscopy (SPM) typically covers atomic force microscopy (AFM), scanning tunneling microscopy (STM), near-field scanning optical microscopy (NSOM, or SNOM) and related technologies. Since its invention in early 1980s, SPM has now been regarded as one of the major driving forces for the rapid development of nanoscience and nanotechnology, and the tool of choice in many areas of research. Journal of Scanning Probe Microscopy (JSPM) provides a forum for rapid dissemination of important developments in SPM technology. JSPM offers scientists, engineers and developers timely, peer-reviewed research on SPM science and technology of the highest quality. JSPM publishes original rapid communications, full research papers and timely state-of-the-art reviews (with author's photo and biography) encompassing the fundamental and applied research on SPM in all fields of science, engineering, and medicine.
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