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Mechanical Properties of Carbon-Nanotube Tips and Nanoneedles: A Frequency Modulation-Atomic Force Microscope Comparative Study

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Mechanical properties of AFM tips with high aspect ratio as single-wall carbon nanotube (SWNT) tips and needles of silicon carved with a focused ion beam (FIB) have been investigated. A phase locked loop (PLL)-controlled frequency modulation-atomic force microscope (FM-AFM) has been used to perform force distance measurements. Based on the understanding of the general mechanical response of the CNTs, we show that SWNTs and nanoneedles exhibit a similar elastic response but a marked difference in the dissipation processes. Nanoneedles show a viscous behavior, while the SWNT mechanical response is purely elastic.
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Keywords: CARBON NANOTUBE; DYNAMIC ATOMIC FORCE MICROSCOPY (FM-AFM); FIB APPLICATIONS; NANOMECHANICAL PROPERTIES; NANONEEDLE AFM TIP

Document Type: Research Article

Publication date: 2006-06-01

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  • Scanning probe microscopy (SPM) typically covers atomic force microscopy (AFM), scanning tunneling microscopy (STM), near-field scanning optical microscopy (NSOM, or SNOM) and related technologies. Since its invention in early 1980s, SPM has now been regarded as one of the major driving forces for the rapid development of nanoscience and nanotechnology, and the tool of choice in many areas of research. Journal of Scanning Probe Microscopy (JSPM) provides a forum for rapid dissemination of important developments in SPM technology. JSPM offers scientists, engineers and developers timely, peer-reviewed research on SPM science and technology of the highest quality. JSPM publishes original rapid communications, full research papers and timely state-of-the-art reviews (with author's photo and biography) encompassing the fundamental and applied research on SPM in all fields of science, engineering, and medicine.
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