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Scanning probe microscopy (SPM) typically covers atomic force microscopy (AFM), scanning tunneling microscopy (STM), near-field scanning optical microscopy (NSOM, or SNOM) and related technologies. Since its invention in early 1980s, SPM has now been regarded as one of the major driving forces for the rapid development of nanoscience and nanotechnology, and the tool of choice in many areas of research. Journal of Scanning Probe Microscopy (JSPM) provides a forum for rapid dissemination of important developments in SPM technology. JSPM offers scientists, engineers and developers timely, peer-reviewed research on SPM science and technology of the highest quality. JSPM publishes original rapid communications, full research papers and timely state-of-the-art reviews (with author's photo and biography) encompassing the fundamental and applied research on SPM in all fields of science, engineering, and medicine.

Publisher: American Scientific Publishers

Volume 1, Number 1, June 2006
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Editorial

Welcome to the Journal of Scanning Probe Microscopy
pp. 1-2(2)
Authors: Shi, San-Qiang; Djurišić, Aleksandra

Reviews

Atomic-Scale Spin-Polarized Scanning Tunneling Microscopy and Atomic Force Microscopy: A Review
pp. 3-20(18)
Author: Smith, Arthur R.

Characterization of Block Copolymers Using Scanning Probe Microscopy
pp. 21-31(11)
Authors: Djurišić, A.B.; Wang, H.; Chan, W.K.; Xie, M.H.

Research Articles

Single Molecule Force Spectroscopy with a Micropipette
pp. 32-38(7)
Authors: Iwamoto, Hideki; Sheng, Sitong; Cao, Jianming; Szabo, Gabor; Shao, Zhifeng

Mechanical Properties of Carbon-Nanotube Tips and Nanoneedles: A Frequency Modulation-Atomic Force Microscope Comparative Study
pp. 39-44(6)
Authors: Dietzel, D.; Bernard, C.; Mariolle, D.; Iaia, A.; Bonnot, A.M.; Aimé, J.P.; Marsaudon, S.; Bertin, F.; Chabli, A.

Communications

Observation of Dendritic Islands within Complete Octadecyltrichlorosilane Monolayers
pp. 45-50(6)
Authors: Wouters, Daan; Hoeppener, Stephanie; Sturms, Jordy P.E.; Schubert, Ulrich S.

NanoLaboratory Concept: A Platform Combining Advanced Scanning Probe Microscopy and Non-Scanning Probe Microscopy Methods
pp. 51-54(4)
Author: Andreyuk, Denis

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