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Structural and Magnetic Studies of [Co0.45Fe0.45Zr0.1/a-Si] N Multilayers

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The essential difference in electronic structure and magnetic properties has been revealed in [Co0.45Fe0.45Zr0.1/a-Si] N multilayers with different thicknesses of sublayers and repetition periods. Multilayers were investigated by the macroscopic magneto-optical transversal Kerr effect (TKE), structure sensitive low-angle X-ray reflectivity method, element-selective X-ray absorption spectroscopy (XANES) and X-ray magnetic circular dichroism (XMCD) at the Zr L2.3 and K absorption edges of Fe and Co. The local probes of electronic and magnetic properties are fully consistent with macroscopic data in assumption of grain formation in initially ferromagnetic Co0.45Fe0.45Zr0.1 sublayers. Different silicides and grains of Co0.45Fe0.45Zr0.1 are created depending on sublayer thicknesses mostly in the interface regions with a-Si layer or spread across the whole Co0.45Fe0.45Zr0.1 sublayer. These two models give a good explanation of the magneto-optical TKE effect enhancement and its huge reduction in the multilayer with larger and smaller sublayer thicknesses respectively.
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Keywords: ELEMENT-SELECTIVE ABSORPTION SPECTROSCOPY; MAGNETIC MULTILAYERS; TRANSVERSAL KERR EFFECT; X-RAY REFLECTIVITY

Document Type: Research Article

Publication date: 2012-04-01

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  • Journal of Spintronics and Magnetic Nanomaterials is an international multidisciplinary peer-reviewed journal reporting new developments in the fields of magnetic and spintronics materials including their synthesis, characterization, properties, and applications in electronics, photonics, telecommunications, computer sciences, medicine, health science, etc. JSM is the first journal devoted to the exciting field of spintronics, which is playing a fundamental role in the novel technological developments based on the new spin torque transfer phenomena.
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