Journal of Low Power Electronics

Non-Volatile Flip-Flop Based on Unipolar ReRAM for Power-Down Applications
pp. 1-10(10)
Authors: Portal, Jean-Michel; Bocquet, Marc; Deleruyelle, Damien; Muller, Christophe

Adaptive Input-Output Selection Based On-Chip Router Architecture
pp. 11-29(19)
Authors: Daneshtalab, M.; Kamali, M.; Ebrahimi, M.; Mohammadi, S.; Afzali-Kusha, A.; Plosila, J.

Optimization of On-Chip Interconnect Signaling for Low Energy and High Performance
pp. 30-38(9)
Authors: Chen, Ge; Nooshabadi, Saeid

Sub-Threshold Delay and Power Analysis of Complementary Metal-Oxide Semiconductor Buffer Driven Interconnect Load for Ultra Low Power Applications
pp. 39-46(8)
Authors: Dhiman, Rohit; Chandel, Rajeevan

A 1.3-μW, 0.6-μm CMOS Current-Frequency Analog-Digital Converter for Implantable Blood-Glucose Monitors
pp. 47-57(11)
Authors: Rincón-Mora, Gabriel A.; Blanco, Andres A.; Vogt, Justin P.

Low-Power Data Driven Symbol Decoder for a UHF Passive RFID Tag
pp. 58-62(5)
Authors: Sai, Vyasa; Ogirala, Ajay; Mickle, Marlin H.

A 0.4 V 520 nW 990 μm² Fully Integrated Frequency-Domain Smart Temperature Sensor in 65 nm CMOS
pp. 63-72(10)
Authors: Chang, Ming-Hung; Lin, Shang-Yuan; Hwang, Wei

Test Pattern Generation Based on Multi-TRC Scan Architecture for Reducing Test Cost
pp. 73-81(9)
Authors: Zhou, Bin; Xiao, Liyi; Ye, Yizheng; Wu, Xinchun; Cao, Bei

Selected Articles from the VARI 2011 Workshop
pp. 82-82(1)
Authors: Azemard, Nadine; Belleville, Marc

Impact of Power Consumption and Temperature on Processor Lifetime Reliability
pp. 83-94(12)
Authors: Gupta, Tushar; Bertolini, Clement; Heron, Olivier; Ventroux, Nicolas; Zimmer, Thomas; Marc, Francois

Pushing Adaptive Voltage Scaling Fully on Chip
pp. 95-112(18)
Authors: De Vos, Julien; Flandre, Denis; Bol, David

Statistical Estimation of Dominant Physical Parameters for Leakage Variability in 32 Nanometer CMOS, Under Supply Voltage Variations
pp. 113-124(12)
Authors: Joshi, Smriti; Lombardot, Anne; Flatresse, Philippe; D'agostino, Carmelo; Juge, Andre; Beigne, Edith; Girard, Stéphane

Ultra-Thin Body and Buried Oxide (UTBB) FDSOI Technology with Low Variability and Power Management Capability for 22 nm Node and Below
pp. 125-132(8)
Authors: Mazurier, J.; Weber, O.; Andrieu, F.; Toffoli, A.; Thomas, O.; Allain, F.; Noel, J.-P.; Belleville, M.; Faynot, O.; Poiroux, T.