Journal of Low Power Electronics

A Markovian Decision-Based Approach for Extending the Lifetime of a Network of Battery-Powered Mobile Devices by Remote Processing
pp. 227-239(13)
Authors: Rong, Peng; Pedram, Massoud

Design and Analysis of Location Caches in a NoC-Based Chip Multiprocessor System
pp. 240-262(23)
Authors: Ramakrishnan, D.; Wu, Y.L.; Jone, W.B.

Low-Leakage and Compact Registers with Easy-Sleep Mode
pp. 263-279(17)
Authors: Jiao, Hailong; Kursun, Volkan

Power-Yield Enhancement for Field Programmable Gate Arrays Under Process Variations
pp. 280-290(11)
Authors: Kumar, Akhilesh; Anis, Mohab

Charge Recycling in Voltage-Dithered Circuits
pp. 291-299(9)
Authors: Schweizer, Thomas; Oliveira, Julio; Kuhn, Tommy; Rosenstiel, Wolfgang

Low-Power Circuit Techniques for Charge-Scaling Successive Approximation Register ADC Design
pp. 300-310(11)
Authors: Kandala, Mallik; Wang, Haibo

Scan Shift Power Reduction by Gating Internal Nodes
pp. 311-319(9)
Authors: Jayaraman, Dheepakkumaran; Sethuram, Rajamani; Tragoudas, Spyros

Analysis and Improvement of Delay-Insensitive Asynchronous Circuits Operating in Subthreshold Regime
pp. 320-324(5)
Authors: Coleman, David; Di, Jia

Selected Peer-Reviewed Articles from the LPonTR 2009 Workshop
pp. 325-325(1)
Author: Bystrov, Alex

Power Supply Noise: Causes, Effects, and Testing
pp. 326-338(13)
Author: Polian, Ilia

Impact of Power Supply Voltage Variations on FPGA-Based Digital Systems Performance
pp. 339-349(11)
Authors: Freijedo, J.; Costas, L.; Semião, J.; Rodríguez-Andina, J.J.; Moure, M.J.; Vargas, F.; Teixeira, I.C.; Teixeira, J.P.

Test Sequences with Reduced and Increased Switching Activity
pp. 350-358(9)
Authors: Pomeranz, Irith; Reddy, Sudhakar M.

A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for Launch-Off-Shift and Launch-Off-Capture Schemes
pp. 359-374(16)
Authors: Wu, F.; Dilillo, L.; Bosio, A.; Girard, P.; Pravossoudovitch, S.; Virazel, A.; Tehranipoor, M.; Wen, X.; Ahmed, N.