Transistor Sizing of Logic Gates to Maximize Input Delay Variability

Authors: Raja, Tezaswi; Agrawal, Vishwani D.; Bushnell, Michael L.

Source: Journal of Low Power Electronics, Volume 2, Number 1, April 2006 , pp. 121-128(8)

Publisher: American Scientific Publishers

Buy & download fulltext article:

OR

Price: $113.00 plus tax (Refund Policy)

Abstract:

The time taken for a CMOS logic gate output to change after one or more inputs have changed is called the delay of the gate. A conventional multi-input CMOS gate is designed to have the same input to output delay irrespective of which input caused the output to change. A gate which can offer different delays for different input-output paths through it, is known as a variable input delay (VID) gate and the maximum difference in delays of any two paths through the gate is known as "ub." The VID gates have a known application in minimizing the active power of a digital CMOS circuit. A previous publication has proposed three different designs for implementing VID gates. In this paper, we describe transistor sizing methods to implement the three types of VID gates for any specified delay requirement. We also describe techniques for calculating the ub for each type of gate design. We outline an algorithm for an efficient determination of the transistor sizes for a gate for given delays and output load capacitance. The algorithm is a two-step approach with a look-up table of sizes in the first stage and a sensitivity based steepest descent method for the second stage. We also give a brief introduction to the power saving potential by maximizing ub when used in conjunction with the previously published technique.
More about this publication?
  • The electronic systems that can operate with very low power are of great technological interest. The growing research activity in the field of low power electronics requires a forum for rapid dissemination of important results: Journal of Low Power Electronics (JOLPE) is that international forum which offers scientists and engineers timely, peer-reviewed research in this field.
  • Editorial Board
  • Information for Authors
  • Subscribe to this Title
  • Terms & Conditions
  • ingentaconnect is not responsible for the content or availability of external websites
Related content

Tools

Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content

Text size:

A | A | A | A
Share this item with others: These icons link to social bookmarking sites where readers can share and discover new web pages. print icon Print this page