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Controlled Electron-Beam-Induced Large-Scale Alignment of Carbon Nanotubes at Metal Electrodes

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Abstract:

Here we demonstrate a self-assembled directional alignment of carbon nanotubes (CNTs) at metal electrodes. This technique utilizes re-organization of surfactant-CNT film along pre-defined stress locations, upon electron-beam irradiation from a standard scanning electron microscope (SEM). Re-organization causes the film to crack and consequently stretches and aligns CNTs embedded within the layer. This phenomenon can be controllably induced on a large scale along the metal pads and is expected to be instrumental for mass-production of CNT based devices.

Keywords: ALIGNMENT; CARBON NANOTUBES; CRACKS; ELECTRON-BEAM; SURFACTANT

Document Type: Research Article

DOI: https://doi.org/10.1166/jno.2006.205

Publication date: 2006-08-01

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  • Journal of Nanoelectronics and Optoelectronics (JNO) is an international and cross-disciplinary peer reviewed journal to consolidate emerging experimental and theoretical research activities in the areas of nanoscale electronic and optoelectronic materials and devices into a single and unique reference source. JNO aims to facilitate the dissemination of interdisciplinary research results in the inter-related and converging fields of nanoelectronics and optoelectronics.
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