Skip to main content

Controlled Electron-Beam-Induced Large-Scale Alignment of Carbon Nanotubes at Metal Electrodes

Buy Article:

$105.00 plus tax (Refund Policy)

Here we demonstrate a self-assembled directional alignment of carbon nanotubes (CNTs) at metal electrodes. This technique utilizes re-organization of surfactant-CNT film along pre-defined stress locations, upon electron-beam irradiation from a standard scanning electron microscope (SEM). Re-organization causes the film to crack and consequently stretches and aligns CNTs embedded within the layer. This phenomenon can be controllably induced on a large scale along the metal pads and is expected to be instrumental for mass-production of CNT based devices.
No Reference information available - sign in for access.
No Citation information available - sign in for access.
No Supplementary Data.
No Article Media
No Metrics


Document Type: Research Article

Publication date: 01 August 2006

More about this publication?
  • Journal of Nanoelectronics and Optoelectronics (JNO) is an international and cross-disciplinary peer reviewed journal to consolidate emerging experimental and theoretical research activities in the areas of nanoscale electronic and optoelectronic materials and devices into a single and unique reference source. JNO aims to facilitate the dissemination of interdisciplinary research results in the inter-related and converging fields of nanoelectronics and optoelectronics.
  • Editorial Board
  • Information for Authors
  • Subscribe to this Title
  • Ingenta Connect is not responsible for the content or availability of external websites
  • Access Key
  • Free content
  • Partial Free content
  • New content
  • Open access content
  • Partial Open access content
  • Subscribed content
  • Partial Subscribed content
  • Free trial content
Cookie Policy
Cookie Policy
Ingenta Connect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more