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Raman-Based Steady-State Thermal Characterization of Multiwall Carbon Nanotube Bundle and Buckypaper

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Electrical methods for thermal characterization, like 3ω method,1 micro-bridge method2 and TET method,3 have been widely used in the thermal property measurement, while always been limited by the electrical conductance of samples or other temperature dependent thermal resistors. As an optical method, Raman thermometry has been developed and broadly applied in thermal characterization in recent years. In this work, we present a steady-state method based on Raman spectroscopy for the localized thermal characterization of micro/nanowires and thin film materials, respectively. The physical models are developed and two kinds of materials: a MWCNT bundle and a piece of buckypaper are measured to validate this method. The thermal conductivities are measured as 4.92 W/m K and 0.83 W/m K for CNT bundle and buckypaper respectively. Compared with other optical methods, this steady-state Raman method features easy and fast way for thermal characterization, being capable of measuring samples from millimeters down to nanometers.
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Document Type: Research Article

Publication date: 01 April 2015

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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