Crystallization of Au–Si/Glass Thin Film: A Real-Time Synchrotron X-Ray Scattering Study
The crystallization of amorphous, Si-rich, Au28Si72/glass thin film was studied in real-time synchrotron X-ray scattering experiments. The amorphous film crystallizes first into Au and Si phases at a low temperature of 206 °C. At annealing temperatures above eutectic temperature (TE = 360 °C), the Au phase melts while the Si phase rapidly grows further. The crystallized Au28Si72 thin film has nanowire-type grains with 1000-nm-length and 10-nm-diameter. We confirm that the Au liquid phase contributes to the low-temperature crystallization of the Si solid phase for Si-nanowire growth.
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Document Type: Research Article
Publication date: 2012-04-01
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