Crystallization Mechanisms of Phase Change (GeSbSn)100−x Co x Optical Recording Films
In this study, the (GeSbSn)100−x Co x films (x = 0∼13.3) were deposited on natural oxidized silicon wafer and glass substrate by dc magnetron co-sputtering of GeSbSn and Co targets. The ZnS-SiO2 films were used as protective layers. The thicknesses of the (GeSbSn)100−x Co x films and protective layer were 100 nm and 30 nm, respectively. We investigated the effects of Co addition on the thermal property, crystallization kinetics, and crystallization mechanism of the GeSbSn recording film. The crystallization temperatures of (GeSbSn)100−x Co x films were decreased with Co content. It was found that the activation energy of the (GeSbSn)100−x Co x films will decrease from 1.53 eV to 0.55 eV as Co content increased from 0 at.% to 13.3 at.%.
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Document Type: Research Article
Publication date: 01 December 2011
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