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Real-Time Ellipsometric Characterization of the Initial Growth Stage of Poly(3,4-ethylene dioxythiophene): Poly(styrene sulfonic acid) Films by Electrospray Deposition

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Kinetic spectroscopic ellipsometry have been used to study the initial growth stage of poly(3,4-polyethylene dioxythiophene):poly(styrenesulfonic acid)(PEDOT:PSS) films by the electrospray deposition (ESD) method. The real-time spectra analysis revealed that the surface overlayer decreased in thickness once the first bulk layer monolayer was formed, indicating a smoothening effect as the nucleation-related microstructure coalesced into the bulk layer. Once the coalescence was completed and the nucleation-induced surface roughness layer was stabilized, the underlying bulk layer increased linearly with time. These results originate from the degrees of the evaporation of solvent material during the transferring the precursors to the surface and/or of the diffusion of deposition precursors after sticking at the growing surface.


Document Type: Research Article

DOI: http://dx.doi.org/10.1166/jnn.2011.5064

Publication date: September 1, 2011

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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