Secondary Ion Mass Spectrometry Study of Thermal Diffusion of Au Nanoparticles in Porous SiO2 Matrices

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Abstract:

Migration of Au nanoparticles by thermal diffusion into porous SiO2 matrix substrates has been studied using secondary ion mass spectroscopy (SIMS). When the samples having four different porosities were annealed at T = 410 K for 1.5 h, no noticeable variations in the thermal diffusion of Au nanoparticles were observed. All the measured diffusion coefficients of Au particles, were an order of 10−15 cm2/s at 300–410 K in a very limited interfacial region. Regardless of their porosities, the pores must be discontinuous, which acts as a diffusion barrier to block the continuous diffusion of Au particles.

Keywords: DIFFUSION CONSTANT; LOW DIELECTRIC MATERIALS; NANOPARTICLES; SECONDARY ION MASS SPECTROMETRY

Document Type: Research Article

DOI: http://dx.doi.org/10.1166/jnn.2011.3635

Publication date: May 1, 2011

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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