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Local Electrical Characteristics of Dielectrophoretically Deposited Carbon Nanotubes

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Electrostatic force microscopy and scanning gate microscopy are employed to investigate the local electrical characteristics of single-walled carbon nanotube (SWCNT) devices that are fabricated by alternating current dielectrophoresis with high spatial resolutions. The results show good electrical anchoring of nanotubes to electrodes and absence of local gate dependence as well as global gate dependence while device resistance can be dominated by contact resistances among bundles of SWCNTs.
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Keywords: CARBON NANOTUBE; DIELECTROPHORESIS; SCANNING PROBE MICROSCOPY

Document Type: Research Article

Publication date: 2011-02-01

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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