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Gas Sensing Property of Perovskite SrTi1−xFexO3− Fabricated by Thick Film Planar Technology

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Planar sensor of SrTi1−xFexO3−, x = 0.4 and 0.6, with perovskite structure was fabricated on alumina substrate using thick film technology. Electrical resistance was measured as a function of thermal treatment conditions, atmosphere, time and temperature. Sensing property was also measured as a function of temperature and the gases of O2, CH4, CO, CO2, NO and NO2. The resistance of SrTi1−xFexO3− is lower than those of SrTiO3 or SrFeO3. TCR (temperature coefficient of resistance) of zero over 550 °C was measured for the composition of SrTi1−xFexO3− after thermal treatment at 1100 °C in air atmosphere only. The perovskite SrTi1−xFexO3− didn't show any response to CH4, CO, CO2, NO and NO2, but an excellent response and recovery characteristics with oxygen concentration.
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Keywords: GAS SENSOR; PEROVSKITE STRUCTURE; RESISTIVE SENSOR; SRTI1-X FEX O3-DELTA

Document Type: Research Article

Publication date: 2011-02-01

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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