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Morphology of the Cross Section of Silica Layer in Rice Husk

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The physical adsorption of nitrogen and gas flow experiments on the silica layer in rice husk indicated that an existence of nano meter sized through holes. In this study, the external shape of the holes on the cross section of the layer was investigated with a scanning electron microscope equipped with an energy dispersive spectrometer, an atomic force microscope and scanning tunneling microscope. In the energy dispersive mapping image, 2–5 micron thick silica layer under outer cellulose layer, silica nano particles in the middle cellulose layer and sub micron silica layer in inner cellulose layer were observed. The cross section of the layer showed 20 nm building units with ∼100 nm convexities. The atomic force microscopic image also showed the ∼100 nm convexities as well as a roughness of ∼20 nm. When osmium was coated on the silica layer, the wells with 2∼5 nm horizontal and ∼2 nm vertical lengths were observed on the plate surface in scanning tunneling microscopic image. From the results, it was suggested that the holes in the rice husk silica layer are almost straight and not zigzag spaces originated from the simple packing of nano particles.
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Keywords: AFM; EDS; NANO PORE; RICE HUSK SILICA; SEM; STM

Document Type: Research Article

Publication date: 2011-02-01

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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