High Frequency Characteristics of Printed Cu Conductive Circuit

Authors: Kim, Jong-Woong; Lee, Young-Chul; Kim, Kwang-Seok; Jung, Seung-Boo

Source: Journal of Nanoscience and Nanotechnology, Volume 11, Number 1, January 2011 , pp. 537-540(4)

Publisher: American Scientific Publishers

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The effects of sintering temperature on microstructural evolution and electrical characteristics of screen printed Cu patterns were observed. A commercial conducting paste containing Cu nanoparticles was screen printed onto a sodalime wafer sintered under a sintering temperature range of 300 °C to 450 °C. A network analyzer and Cascade's probe system in the frequency range of 10 MHz to 20 GHz were employed to measure the S-parameters of the sintered Cu conducting patterns. From the measured S-parameters, the insertion losses in high frequencies decreased with increasing sintering temperature due to the formation of an interparticle necking after heat treatment at high temperatures. However, oxidation of Cu nanoparticles during the sintering deteriorated the RF performance of the circuits, resulting large deviation of the S-parameters from the simulated curves.


Document Type: Research Article

DOI: http://dx.doi.org/10.1166/jnn.2011.3160

Publication date: January 1, 2011

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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