Field Emission Property of Hydrogenated Chemical Vapor Deposited Diamond Films Studied by Scanning Tunneling Microscopy

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By using scanning tunneling microscopy, the plots of tunneling current versus applied voltage, at the local points for hydrogenated and oxygenated chemical vapor deposited diamond films, were investigated. For comparison, the measurement points were adopted on the centers of the crystalline grains and at the grain boundaries, respectively. The results indicated that, for the hydrogenated chemical vapor deposited diamond, the field emission character is much better on the center of the crystalline grains than at the grain boundary. In contrast, for the oxygenated samples, the crystalline grains show a poor field emission character. The two diamond surfaces exhibit similar field emission characters at the grain boundaries. The surface emission mechanisms of the hydrogenated chemical vapor deposited diamond films were also discussed.


Document Type: Research Article


Publication date: November 1, 2010

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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