Investigation of Fullerene Embedded Silicon Surfaces with Scanning Probe Microscopy
Abstract:This study examines the intramolecular structures of individual fullerene molecules on a Si(111)-7 × 7 surface using an ultra-high vacuum scanning tunneling microscope. This study also discusses possible configurations of fullerene molecules with related orientations and electronic states of fullerene. A self-assembled layer of fullerene on a Si(111) surface is produced using special annealing treatments. The resulting electronic states and band gap energy can be estimated from I–V curves. Finally the field emission parameters, such as turn-on field and field enhancement factor , are determined using a traditional detecting system.
Document Type: Research Article
Publication date: November 1, 2010
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