Investigation of Fullerene Embedded Silicon Surfaces with Scanning Probe Microscopy

$113.00 plus tax (Refund Policy)

Buy Article:

Abstract:

This study examines the intramolecular structures of individual fullerene molecules on a Si(111)-7 × 7 surface using an ultra-high vacuum scanning tunneling microscope. This study also discusses possible configurations of fullerene molecules with related orientations and electronic states of fullerene. A self-assembled layer of fullerene on a Si(111) surface is produced using special annealing treatments. The resulting electronic states and band gap energy can be estimated from IV curves. Finally the field emission parameters, such as turn-on field and field enhancement factor , are determined using a traditional detecting system.

Keywords: AFM; FIELD EMISSION; FULLERENE; SI(111); STM

Document Type: Research Article

DOI: http://dx.doi.org/10.1166/jnn.2010.2877

Publication date: November 1, 2010

More about this publication?
  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
  • Editorial Board
  • Information for Authors
  • Subscribe to this Title
  • Terms & Conditions
  • ingentaconnect is not responsible for the content or availability of external websites
Related content

Tools

Favourites

Share Content

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
X
Cookie Policy
ingentaconnect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more