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Optimization of Zero-Reference Grating Considering Tip Distortions for Scanning Probe Microscopy Drift Measurement

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Abstract:

A nonperiodic grating composed of unevenly distributed step elements on a flat substrate can serve as the calibration grating for scanning probe microscopy (SPM) drift measurements. The grating named zero-reference grating (ZRG) is characterized by the number of step elementst, the number of total grating elements n and the maximum correlation peak contrast D. To optimize the ZRG structures considering tip distortions in SPM images, mathematical morphology and genetic algorithms are adopted. Results show that the optimal step elements tend to distribute orderly under the influence of large tip radius and the contrast D decreases with the increase of tip radius when tn/2. On the contrary, the optimal ZRG structures and the contrast D are insensitive to tip distortions when t > n/2. These differences can be interpreted by the effective code mechanism due to tip dilation. For quantitative drift measurements, the parameter tis suggested to be larger than n/2 since the performances of such optimal ZRGs are more robust to tip distortions.

Keywords: DRIFT; SCANNING PROBE MICROSCOPY; ZERO-REFERENCE GRATING

Document Type: Research Article

DOI: http://dx.doi.org/10.1166/jnn.2010.2857

Publication date: November 1, 2010

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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