Authors: Liu, Lian-Qing; Xi, Ning; Wang, Yue-Chao; Dong, Zai-Li

Source: Journal of Nanoscience and Nanotechnology, Volume 10, Number 11, November 2010 , pp. 7010-7014(5)

Publisher: American Scientific Publishers

Abstract:

Random drift and faulty visual display are the main problems in Atomic Force Microscopy (AFM) based robotic nanomanipulation. As far as we know, there are no effective methods available to solve these problems. In this paper, an On-line Sensing and Display (OSD) method is proposed to solve these problems. The OSD method mainly includes two subprocesses: Local-Scan-Before-Manipulation (LSBM) and Local-Scan-After-Manipulation (LSAM). During manipulation, LSBM and LSAM are on-line performed for random drift compensation and faulty visual display correction respectively. Through this way, the bad influence aroused from random drift and faulty visual display can be eliminated in real time. The visual feedback keeps consistent with the true environment changes during the process of manipulation, which makes several operations being finished without an image scan in between. Experiments show the increased effectiveness and efficiency of AFM based nanomanipulation.

Keywords: NANOMANIPULATION; RANDOM DRIFT; VISUAL DISPLAY; LOCAL SCAN; AFM

Document Type: Research article

DOI: http://dx.doi.org/10.1166/jnn.2010.2840

Publication date: 2010-11-01

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• Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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