Authors: Cambel, V.; Eliáš, P.; Gregušová, D.; Fedor, J.; Martaus, J.; Karapetrov, G.; Novosad, V.; Kostič, I.

Source: Journal of Nanoscience and Nanotechnology, Volume 10, Number 7, July 2010 , pp. 4477-4481(5)

Publisher: American Scientific Publishers

Abstract:

Using micromagnetic calculations we search for optimal magnetic properties of novel magnetic tips to be used for a Switching Magnetization Magnetic Force Microscopy (SM-MFM), a novel technique based on two-pass scanning with reversed tip magnetization. Within the technique the sum of two scans images local atomic forces and their difference maps the local magnetic forces. The tip magnetization is switched during the scanning by a small magnetic field. The technology of novel low-coercitive magnetic tips is proposed. For best performance the tips must exhibit low magnetic moment, low switching field, and single-domain state at remanence. Such tips are equipped with Permalloy objects of a precise shape that are defined on their tilted sides. We calculate switching fields of such tips by solving the micromagnetic problem to find the optimum shape and dimensions of the Permalloy objects located on the tips. Among them, hexagon was found as the best shape for the tips.

Keywords: MAGNETIC FORCE MICROSCOPY; MICROMAGNETIC CALCULATIONS; SWITCHING FIELD

Document Type: Research article

DOI: http://dx.doi.org/10.1166/jnn.2010.2366

Publication date: 2010-07-01

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• Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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