Temperature Dependence of Bis(triisopropylsilylethynyl)-Pentacene Nanofilm Deposited on Octadecyltrichlorosilane Self Assembled Monolayer Surface as a Transistor Channel
Highly pure 6,13-bis(triisopropylsilylethynyl)pentacene (TIPS-PEN) nanofilms were deposited on a hydrophobic OTS-SAM surface at two different substrate temperatures (70 °C and 90 °C) via the vacuum thermal evaporation (VTE) method. X-ray reflectivity measurements over a wide temperature range (30 °C–284 °C) revealed that out-of-plane crystallinity of the film (∼10 nm) remains intact but in-plane crystallinity starts to become poor from ∼100 °C, and to become much more worse from 260 °C. Atomic force microscope images showed that TIPS-PEN films (∼55 nm) prepared at the substrate temperature of 90 °C or above commonly have a number of huge cracks between enormous crystal domains (up to 3 m) whereas the films didn't form such morphology below Ts = 90 °C. These results clearly suggest that an optimum substrate temperature of TIPS-PEN nanofilms on OTS-SAM surface must be somewhere between 70 °C and 90 °C, and the process temperature must be kept below 90 °C in order to form and maintain a highly crystalline film for an organic thin film transistor device since in-plane crystallinity of a semiconductor channel deeply affects the performance of a transistor.
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Document Type: Research Article
Publication date: 2010-05-01
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