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Measuring Anisotropic Friction on WTe2 Using Atomic Force Microscopy in the Force–Distance and Friction Modes

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Abstract:

Layered materials which can be easily cleaved have proved to be excellent samples for the study of atomic scale friction. The layered transition metal dichalcogenides have been particularly popular. These materials exhibit a number of interesting properties ranging from superconductivity to low frictional coefficients. In this paper we have investigated the tribology of the dichalcogenide-WTe2. The coefficient of friction is less than 0.040 along the Te rows and increases to over 0.045 across the rows. The frictional forces almost doubled at normal loads of 5000 nN when scanning in the [010] direction in comparison to the [100] direction. The frictional responses of the AFM probe have been monitored in the frictional force and force-versus-distance (fd) mode. A comparison between the outcomes using the two different modes demonstrates the factors which need to be considered for accurate measurements.

Keywords: AFM; ANISOTROPIC; ATOMIC FORCE MICROSCOPY; FORCE DISTANCE; FRICTION; FRICTIONAL FORCE; STICK-SLIP; WTE2

Document Type: Research Article

DOI: http://dx.doi.org/10.1166/jnn.2010.1400

Publication date: April 1, 2010

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  • Journal for Nanoscience and Nanotechnology (JNN) is an international and multidisciplinary peer-reviewed journal with a wide-ranging coverage, consolidating research activities in all areas of nanoscience and nanotechnology into a single and unique reference source. JNN is the first cross-disciplinary journal to publish original full research articles, rapid communications of important new scientific and technological findings, timely state-of-the-art reviews with author's photo and short biography, and current research news encompassing the fundamental and applied research in all disciplines of science, engineering and medicine.
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